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Presentation of case study on appearance inspection using image sensors [Semiconductor inspection case]!

Quality control in wafer and mask inspection! An important role in excellent wafer inspection systems.

We would like to introduce examples of semiconductor inspection using high-performance sensors, cameras, frame grabbers, image processing devices, and image processing software. The Teledyne Dalsa "Falcon2 CMOS Camera" has a resolution of several hundred megapixels and a high frame rate, making it suitable for area scan inspection systems. The "TDI Line Scan Camera" has high sensitivity and plays an important role in excellent wafer inspection systems. 【Case Overview】 ■ Semiconductor Wafer Inspection ■ Semiconductor Mask Inspection *For more details, please refer to the PDF document or feel free to contact us.